[FLINK-14705] Remove nullables argument of BatchTestBase.registerCollection in blink planner

• Type: Improvement
• Status: Open
• Priority: Not a Priority
• Resolution: Unresolved
• Component/s: Table SQL / Runtime
• Labels: auto-deprioritized-major auto-deprioritized-minor
• Assignee: Unassigned
• Reporter: Danny Chen
• Created: 11/Nov/19 11:47
• Updated: 21/Nov/21 10:38

Description

The register collection method use TypeInformation to register collections, the type information does not have nullability attribute, we expect to use the new DataType instead.

So for these test cases,