[ACCUMULO-2849] Add scan batch size configurability and write delay to memory stress test

• Type: Improvement
• Status: Resolved
• Priority: Minor
• Resolution: Fixed
• Fix Version/s: 1.5.2, 1.6.1, 1.7.0
• Component/s: test
• Assignee: Bill Havanki
• Reporter: Bill Havanki
• Created: 02/Jun/14 13:09
• Updated: 11/May/15 16:40
• Resolved: 11/May/15 16:40

Description

I had the opportunity to work with the memory stress tool created under ACCUMULO-2789. Two features which I added to help the tests along would be helpful:

1. Allowing the scanner batch size to be configured, to reduce memory demand when fetching very large keys or values
2. Adding a configurable write delay, to reduce pressure on tablet servers to minor compact.

Issue Links

• is depended upon by: ACCUMULO-2850 Enhance memory stress test scripts
• requires: ACCUMULO-2789 Add a system stress test based on key/cell/row size
• links to: Review